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IEEE 1149.1-2001 技术规范

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IEEE 1149.1-2001 技术规范
IEEE Std 1149.1-2001
(Revision of IEEE Std 1149.1-1990)




IEEE Standard Test Access Port and
Boundary-Scan Architecture


Sponsor
Test Technology Standards Committee
of the
IEEE Computer Society


Approved 14 June 2001
IEEE-SA Standards Board



Abstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and
support of assembled printed circuit boards is defined. The circuitry includes a standard interface
through which instructions and test data are communicated. A set of test features is defined,
including a boundary-scan register, such that the component is able to
标签: IEEE标准规范IEEE1149.1-2001
IEEE 1149.1-2001 技术规范
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