EOS与ESD

EOS与ESD
EOS/ESD Testing Today
EOS or ESD ?

ESD - Electro-Static Discharge
“Equalization of different electrostatic potentials
between two or more objects”

EOS - Electrical Over-Stress
“An electrical event that is outside the specified
range of the device under test” (Latch-up)




2
EOS or ESD !


Both will damage devices by a rapid localized heating of
the semiconductor material or by rapidly creating strong
electrical fields

Critically, even very small discharges or over-stress can
be fatal or cause latent failures




3
Dominant ESD Test Methods


(HBM) Human Body Model
(MM) Machine Model
(CDM) Charged Device Model